IEEE WORKSHOP on CONTEXT-BASED VISION (In Conjunction with ICCV) Massachusetts Institute of Technology Cambridge, Massachusetts June 19, 1995 Co-Chairs: Joseph L. Mundy Tom Strat GE Corporate R&D SRI International Schenectady, NY Menlo Park, CA mundy@crd.ge.com strat@ai.sri.com This workshop aims to stimulate and exchange research ideas on the use of context and stored knowledge for the development of reliable computer vision systems. Most current research on computer vision seeks automated methods for extracting information from imagery without the use of a priori information, except perhaps some knowledge of the image acquisition (camera model, light source, etc). Such approaches are very general, but have not yet proven capable of coping with the wide range of variability encountered in real world scenes. Another school of thought seeks to increase the robustness of computer vision systems by adopting more restrictive assumptions. The use of specific prior information about the geometry, photometry, and semantic constraints in a scene can permit reliable visual understanding by relatively simple vision algorithms. Thee are many applications in which the existence of prior scene knowledge is readily available or easily obtainable and provides context for selecting and conditioning computer vision algorithms. For example: -- Maps or 3D geometric scene models constrain recognition and change detection algorithms. -- Incrementally compiled world maps aid image interpretation for mobile robots. -- Anatomical descriptions guide analysis of medical imagery. -- Manual graphical annotations aid semiautomated computer vision tasks. -- Linguistic descriptions of scenes can be used to focus search The key questions to be discussed at this workshop are: * What contextual information, if made available beforehand, could best enhance the reliability of computer vision systems? * How can computer vision algorithms be designed to best exploit prior knowledge about a scene? Workshop Format: The workshop program will be formed from invited and contributed papers. It is expected there will be 25-30 attendees with a program of about 10 papers. The papers will be 30 minutes each including a 5 minute question period. A published proceedings will be available at the workshop. Program Committee: Tom Strat Joseph Mundy Eamon Barrett Kim Boyer SRI Int. GE Corp R&D Lockheed Corp. Ohio State Dan Huttenlocher Avi Kak Laveen Kanal Mike Kelly Cornell Univ. Purdue Univ. LNK Associates BDM Jean Ponce Azriel Rosenfeld Demetri Terzopoulos Ed Zelnio Univ. of Illinois Univ. of Maryland Univ.of Toronto Wright Labs Submission: Please submit three(3) copies of your manuscript to: Tom Strat SRI International 333 Ravenswood Avenue Menlo Park, CA 94025 The deadline for submission is January 16, 1995 Notification of acceptance: March 1, 1995 Final Manuscripts due at IEEE: April 3, 1995