IEEE WORKSHOP on CONTEXT-BASED VISION
(In Conjunction with ICCV)
Massachusetts Institute of Technology
Cambridge, Massachusetts
June 19, 1995
Co-Chairs: Joseph L. Mundy Tom Strat
GE Corporate R&D SRI International
Schenectady, NY Menlo Park, CA
mundy@crd.ge.com strat@ai.sri.com
This workshop aims to stimulate and exchange research ideas on the use
of context and stored knowledge for the development of reliable
computer vision systems. Most current research on computer vision
seeks automated methods for extracting information from imagery
without the use of a priori information, except perhaps some knowledge
of the image acquisition (camera model, light source, etc). Such
approaches are very general, but have not yet proven capable of coping
with the wide range of variability encountered in real world scenes.
Another school of thought seeks to increase the robustness of computer
vision systems by adopting more restrictive assumptions. The use of
specific prior information about the geometry, photometry, and semantic
constraints in a scene can permit reliable visual understanding by
relatively simple vision algorithms.
Thee are many applications in which the existence of prior scene
knowledge is readily available or easily obtainable and provides
context for selecting and conditioning computer vision algorithms.
For example:
-- Maps or 3D geometric scene models constrain recognition
and change detection algorithms.
-- Incrementally compiled world maps aid image interpretation
for mobile robots.
-- Anatomical descriptions guide analysis of medical imagery.
-- Manual graphical annotations aid semiautomated computer
vision tasks.
-- Linguistic descriptions of scenes can be used to focus search
The key questions to be discussed at this workshop are:
* What contextual information, if made available beforehand, could
best enhance the reliability of computer vision systems?
* How can computer vision algorithms be designed to best exploit prior
knowledge about a scene?
Workshop Format:
The workshop program will be formed from invited and contributed papers.
It is expected there will be 25-30 attendees with a program of about
10 papers. The papers will be 30 minutes each including a 5 minute
question period. A published proceedings will be available at the
workshop.
Program Committee:
Tom Strat Joseph Mundy Eamon Barrett Kim Boyer
SRI Int. GE Corp R&D Lockheed Corp. Ohio State
Dan Huttenlocher Avi Kak Laveen Kanal Mike Kelly
Cornell Univ. Purdue Univ. LNK Associates BDM
Jean Ponce Azriel Rosenfeld Demetri Terzopoulos Ed Zelnio
Univ. of Illinois Univ. of Maryland Univ.of Toronto Wright Labs
Submission:
Please submit three(3) copies of your manuscript to:
Tom Strat
SRI International
333 Ravenswood Avenue
Menlo Park, CA 94025
The deadline for submission is January 16, 1995
Notification of acceptance: March 1, 1995
Final Manuscripts due at IEEE: April 3, 1995