IAPR Workshop on Graphics Recognition
(sponsored by the International Association for Pattern Recognition)
The Pennsylvania State University
University Park, Pennsylvania, 16802 USA
August 10-11, 1995
You are invited to participate in a single-track 2-day workshop on
methods and systems for graphics recognition organized by IAPR TC-10
(Technical Committee on Graphics Recognition). The workshop will
comprise several sessions dedicated to specific topics. For each
session, there will be 1 or 2 main paper presentations giving the
state of the art and stating the open questions for the session's
topic, followed by a number of short presentations where each
participant is invited to contribute by proposing solutions to some of
the questions or presenting results of his/her work. Each session
will be concluded by a panel discussion. There will also be time for
working groups where participants can discuss in detail specific
problems.
The workshop will be held just before the 3rd International Conference
on Document Analysis and Recognition (Montreal, Canada, August 1995).
Attendance will be limited to 75 persons. All participants are
expected to contribute actively to the workshop, either by presenting
a full state-of-the-art paper, or by an abstract of remarks on a
specific topic. You are invited to submit to the program committee an
abstract (maximum 2 pages) of your proposed contribution to the
workshop. Please indicate also if you would be willing to present a
state-of-the-art paper on this topic, if invited to do so by the
program committee.
Pre-proceedings of all contributed papers will be available at the
workshop for the participants. After the workshop, the program
committee plans to publish as a book revised versions of selected key
papers, possibly including reports from the panel discussion groups.
Relevant topics include but are not limited to:
- raster-to-vector techniques
- recognition of graphical primitives
- recognition of graphic symbols in charts and diagrams
- interpretation of engineering drawings, logic diagrams, maps,
charts, etc.
- analysis of line drawings, tables, forms etc.
- 3-D models from multiple 2-D views
- description of complete systems for interpretation of graphics in
scanned documents
Workshop Organization
Chairs:
Rangachar Kasturi
Department of Computer Science and Engineering
Penn State University
University Park, PA 16802, USA
Email: kasturi@cse.psu.edu, Phone: +1 (814) 863-4254, Fax: +1 (814) 865-3176
Karl Tombre
INRIA Lorraine & CRIN/CNRS
Batiment LORIA,
615 rue du jardin botanique, B.P. 101
54602 Villers-les-Nancy Cedex, France
Email: tombre@loria.fr, Phone: +33 83 59 20 71, Fax: +33 83 27 83 19
Program Committee:
Sergey Ablameyko Institute of Engineering Cybernetics, Minsk, Belarus
Atul Chhabra NYNEX Science & Technology, USA
Vincenzo Consorti IBM SEMEA, Italy
Luigi Cordella Naples University, Italy
Dov Dori Technion Haifa, Israel
Osamu Hori Toshiba R&D Center, Japan
Stephen Joseph Sheffield University, UK
Gerd Maderlechner Siemens AG, Germany
Babu Mehtre ISS, National University, Singapore
Lawrence O'Gorman AT&T Bell Labs, USA
Theo Pavlidis SUNY at Stony Brook, USA
Ken Tomiyama Aoyama Gakuin University, Japan
Abstracts (max. 2 pages, 3 copies): December 31, 1994
Acceptance notification: March 15, 1995
Camera Ready Manuscripts: May 15, 1995
Please send your abstract to one of the co-chairs. Contact either one
of the co-chairs for further information.
Karl Tombre - INRIA Lorraine & CRIN-CNRS --- Email: Karl.Tombre@loria.fr
Post: Batiment LORIA, BP 239, 54506 Vandoeuvre CEDEX, France --or--
615 rue du jardin botanique, BP 101, 54602 Villers CEDEX, France
Phone: +33 83.59.20.71 --- Fax: +33 83.41.30.79 --or-- +33 83.27.83.19
WWW.