Machine Vision Applications in Industrial Inspection 1996
Conference Chairs: A. Ravishankar Rao, IBM Thomas J. Watson Research Ctr.;
Ning Chang, KLA Instruments Corp.
Program Committee:
Joon Han Pohang University
Robert Haralick University of Washington
John Jordan Tencor Instruments
Shree Nayar Columbia University
Maria Petrou University of Surrey
Jorge Sanz University of Illinois
Ken Tobin Oak Ridge National Laboratory
Machine vision systems can augment human vision capabilities in repetitive or
high-speed industrial inspection tasks or when precise visual measurement and
inspection are required. These systems improve manufacturing productivity,
quality, and compliance with product standards, and thus provide a competitive
advantage. Improvements in machine vision hardware, algorithms, and software
expand the range of industrial processes to which this technology can be
successfully applied.
This conference brings together practitioners and researchers in machine
vision to share recent developments in computer vision architectures,
hardware, algorithms, and software for industrial inspection tasks. Papers are
solicited but not limited to the following areas:
* new or improved algorithms for industrial inspection
* novel hardware designs for machine vision systems
* robot vision and tracking
* verification and identification
* performance evaluation of algorithms
* use of 3D or color imaging techniques
* automatic defect classification
* software systems for flexible automatic inspection
* applications of machine vision in microelectronics manufacturing, web
and paper products, glass and steel inspection, food and agriculture,
and pharmaceuticals.
Papers emphasizing fundamental methods that are widely applicable to
industrial inspection are especially welcome. All submissions will be peer
reviewed. Please note that abstracts must be at least 500 words in length in
order to receive full consideration.
This conference is just one of nearly 30 conferences to be held at the EI'96
symposium. And EI'96 is just part of the larger Photonics West Symposium being
held 27 January - 2 February 1996, San Jose Convention Ctr., San Jose,
California USA.
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Electronic Imaging '96 DEADLINES
Paper Abstracts Due from Authors:
3 July 1995
Advance Programs due from Chairs:
31 July 1995
Manuscripts Due from Authors:
2 January 1996
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Send a 500 word abstract of your paper, by the appropriate deadline, in ONE of
the following ways:
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IS&T/SPIE Electronic Imaging '96
SPIE, P.O. Box 10, Bellingham, WA 98227-0010
Shipping Address: 1000 20th Street, Bellingham, WA 98225
Telephone: 360/676-3290 (*)
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mailing address, phone/fax numbers, email
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4. ABSTRACT TEXT: 500 words typed on white paper
5. KEYWORDS: maximum of 5 keywords
6. BRIEF BIOGRAPHY of the principal author: 50-100 words
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