Technology, and Applications - Photonics China '96


Automated Optical Inspection for Industry: Theory, Technology, and
Applications

Part of SPIE's 1996 International Photonics China Symposium on
Lasers, Optoelectronics and Microphotonics
4-7 November 1996 * China International Exhibition Center * Beijing, China

Conference Chairs: Shenghua Ye, Tianjin Univ. (China); Frederick Y. Wu, IBM
Thomas J. Watson Research Ctr. (USA)

Program Committee: Moritoshi Ando, Fujitsu Labs. Ltd. (Japan); Dragana
Brzakovic, Lehigh Univ. (USA); John R. Dralla, Optical Specialties, Inc.
(USA); Joon H. Han, Pohang Institute of Science and Technology (Korea); Haibao
Lu, National Univ. of Defense Technology (China); Maria Petrou, Univ. of
Surrey (UK); Hung T. Tsui, Chinese Univ. of Hong Kong; Jiaxiong Ye, Huazhong
Univ. of Science and Technology (China); Zheng You, Tsinghua Univ. (China);
Guangjun Zhang, Beijing Univ. of Aeronautics and Astronautics (China)

Rapid growth of industrial economies depends on the application of technology
to improve productivity while maintaining high manufacturing quality. A key
factor in low-cost high- quality production is judicious use of automatic
inspection. Recent developments in optoelectronic technology, availability of
powerful, inexpensive computing power, and advances in machine vision
algorithms have greatly expanded the range of applications in which
optoelectronic inspection is cost-effective. In many of these applications
human visual inspection is simply too slow, too expensive, too tedious, and
too unreliable. In others, new imaging techniques allow previously
unobservable defects to be detected.

        In this conference, developers and researchers can share recent work and
new ideas that will further advance the field. Papers are solicited in the
areas of:

   +    high-speed optical inspection systems
   +    novel inspection algorithms or architectures
   +    defect image analysis, learning, and classification
   +    3D or color imaging in automated inspection
   +    novel defect imaging techniques
   +    electronic component and board inspection
   +    automated  inspection  in continuous process or discrete part
        manufacturing
   +    automated inspection of other products, including  agricultural, forest,
        food, and raw materials.

        Papers emphasizing fundamental methods that are widely applicable to
industrial inspection are especially welcome.

The chairs of this conference request that abstracts be at least 500 words in
length in order to receive full consideration.


This conference is just one of 16 conferences to be held at the Photonics
China '96 symposium:

4-7 November 1996
China International Exhibition Center
Beijing, China

TO OBTAIN ALL CALLS FOR PAPERS ELECTRONICALLY
The calls for papers for all conferences in the Photonics China '96 symposium
will be available 26 January 1996 on
SPIE Web
(http://www.spie.org/web/meetings/calls/pc96_home.html),
by anonymous FTP
(ftp://spie.org/meetings/calls/pc96*),
or by e-mail file retrieval
send a message to info-spie-request@spie.org with the following in the message
body:
send [meetings.calls]pc96*

For a printed call for papers or other information:
E-mail: pc96@spie.org
Fax: 360/647-1445 (*)
Phone: 360/676-3290 (*)

IMPORTANT DEADLINES
Paper Abstracts Due from Authors:
        8 April 1996
Advance Programs due from Chairs:
        6 May 1996
Manuscripts Due from Authors:
        12 August 1996

Note: All conferences will have on-site Proceedings.

GUIDELINES FOR SUBMITTING AN ABSTRACT

Send a 250 word abstract of your paper, by the appropriate deadline, in ONE of
the following ways:

>>mail (please mail 4 hard copies) to:
        Photonics China '96
        SPIE, P.O. Box 10, Bellingham, WA  98227-0010
        Shipping Address: 1000 20th Street, Bellingham, WA  98225
        Telephone: 360/676-3290 (*)
>>electronic mail in ASCII format to Internet abstracts@spie.org
        Please submit one abstract per email message.  On the subject line,
        write PC96 and the name of the conference chair.
        Example: SUBJECT: PC96 (John Smith)
>>fax to SPIE at 360/647-1445 (*)
        Please submit one abstract per fax.

Be sure each abstract includes the following:

1. CONFERENCE CHAIR and CONFERENCE TITLE (submit to ONLY ONE conference)
        to which the abstract is submitted

2. AUTHOR LISTING (List principal author first)
        for each author: full name and affiliation, mailing address, phone/fax
        numbers, email

3. ABSTRACT/PAPER TITLE

4. ABSTRACT TEXT: 250 words typed on white paper

5. KEYWORDS: maximum of 5 keywords

6. BRIEF BIOGRAPHY of the principal author: 50-100 words

Please contact SPIE if you have any questions or require further information.

(*) Please note:
SPIE's area code changed from 206 to 360 in February 1995. If you experience
any difficulty using the 360 area code, please use 206 and notify SPIE, your
local phone company, and the people in charge of the phone system from where
you placed your call. You may also call 1-800-441-5516 to report the
difficulty. Thank you for your patience while US West and other regional phone
companies fix this problem.

Eric Lee, Technical Program Coordinator
                S P I E
P.O. Box 10  Bellingham, WA  98227-0010
(360) 676-3290 x611  FAX (360) 647-1445
         e-mail EricL@spie.org