Technology, and Applications - Photonics China '96 Automated Optical Inspection for Industry: Theory, Technology, and Applications Part of SPIE's 1996 International Photonics China Symposium on Lasers, Optoelectronics and Microphotonics 4-7 November 1996 * China International Exhibition Center * Beijing, China Conference Chairs: Shenghua Ye, Tianjin Univ. (China); Frederick Y. Wu, IBM Thomas J. Watson Research Ctr. (USA) Program Committee: Moritoshi Ando, Fujitsu Labs. Ltd. (Japan); Dragana Brzakovic, Lehigh Univ. (USA); John R. Dralla, Optical Specialties, Inc. (USA); Joon H. Han, Pohang Institute of Science and Technology (Korea); Haibao Lu, National Univ. of Defense Technology (China); Maria Petrou, Univ. of Surrey (UK); Hung T. Tsui, Chinese Univ. of Hong Kong; Jiaxiong Ye, Huazhong Univ. of Science and Technology (China); Zheng You, Tsinghua Univ. (China); Guangjun Zhang, Beijing Univ. of Aeronautics and Astronautics (China) Rapid growth of industrial economies depends on the application of technology to improve productivity while maintaining high manufacturing quality. A key factor in low-cost high- quality production is judicious use of automatic inspection. Recent developments in optoelectronic technology, availability of powerful, inexpensive computing power, and advances in machine vision algorithms have greatly expanded the range of applications in which optoelectronic inspection is cost-effective. In many of these applications human visual inspection is simply too slow, too expensive, too tedious, and too unreliable. In others, new imaging techniques allow previously unobservable defects to be detected. In this conference, developers and researchers can share recent work and new ideas that will further advance the field. Papers are solicited in the areas of: + high-speed optical inspection systems + novel inspection algorithms or architectures + defect image analysis, learning, and classification + 3D or color imaging in automated inspection + novel defect imaging techniques + electronic component and board inspection + automated inspection in continuous process or discrete part manufacturing + automated inspection of other products, including agricultural, forest, food, and raw materials. Papers emphasizing fundamental methods that are widely applicable to industrial inspection are especially welcome. The chairs of this conference request that abstracts be at least 500 words in length in order to receive full consideration. This conference is just one of 16 conferences to be held at the Photonics China '96 symposium: 4-7 November 1996 China International Exhibition Center Beijing, China TO OBTAIN ALL CALLS FOR PAPERS ELECTRONICALLY The calls for papers for all conferences in the Photonics China '96 symposium will be available 26 January 1996 on SPIE Web (http://www.spie.org/web/meetings/calls/pc96_home.html), by anonymous FTP (ftp://spie.org/meetings/calls/pc96*), or by e-mail file retrieval send a message to info-spie-request@spie.org with the following in the message body: send [meetings.calls]pc96* For a printed call for papers or other information: E-mail: pc96@spie.org Fax: 360/647-1445 (*) Phone: 360/676-3290 (*) IMPORTANT DEADLINES Paper Abstracts Due from Authors: 8 April 1996 Advance Programs due from Chairs: 6 May 1996 Manuscripts Due from Authors: 12 August 1996 Note: All conferences will have on-site Proceedings. GUIDELINES FOR SUBMITTING AN ABSTRACT Send a 250 word abstract of your paper, by the appropriate deadline, in ONE of the following ways: >>mail (please mail 4 hard copies) to: Photonics China '96 SPIE, P.O. Box 10, Bellingham, WA 98227-0010 Shipping Address: 1000 20th Street, Bellingham, WA 98225 Telephone: 360/676-3290 (*) >>electronic mail in ASCII format to Internet abstracts@spie.org Please submit one abstract per email message. On the subject line, write PC96 and the name of the conference chair. Example: SUBJECT: PC96 (John Smith) >>fax to SPIE at 360/647-1445 (*) Please submit one abstract per fax. Be sure each abstract includes the following: 1. CONFERENCE CHAIR and CONFERENCE TITLE (submit to ONLY ONE conference) to which the abstract is submitted 2. AUTHOR LISTING (List principal author first) for each author: full name and affiliation, mailing address, phone/fax numbers, email 3. ABSTRACT/PAPER TITLE 4. ABSTRACT TEXT: 250 words typed on white paper 5. KEYWORDS: maximum of 5 keywords 6. BRIEF BIOGRAPHY of the principal author: 50-100 words Please contact SPIE if you have any questions or require further information. (*) Please note: SPIE's area code changed from 206 to 360 in February 1995. If you experience any difficulty using the 360 area code, please use 206 and notify SPIE, your local phone company, and the people in charge of the phone system from where you placed your call. You may also call 1-800-441-5516 to report the difficulty. Thank you for your patience while US West and other regional phone companies fix this problem. Eric Lee, Technical Program Coordinator S P I E P.O. Box 10 Bellingham, WA 98227-0010 (360) 676-3290 x611 FAX (360) 647-1445 e-mail EricL@spie.org