MACHINE VISION APPLICATIONS in INDUSTRIAL INSPECTION 1997 Conference Chairs: A. Ravishankar Rao, IBM Thomas J. Watson Research Ctr.; Ning Chang, KLA Instruments Corp. Machine vision systems can augment human vision capabilities in repetitive or high-speed industrial inspection tasks or when precise visual measurement and inspection are required. These systems improve manufacturing productivity, quality, and compliance with product standards, and thus provide a competitive advantage. Improvements in machine vision hardware, algorithms, and software expand the range of industrial processes to which this technology can be successfully applied. This conference brings together practitioners and researchers in machine vision to share recent developments in computer vision architectures, hardware, algorithms, and software for industrial inspection tasks. Papers are solicited but not limited to the following areas: * new or improved algorithms for industrial inspection * novel hardware designs for machine vision systems * robot vision and tracking * verification and identification * performance evaluation of algorithms * use of 3D or color imaging techniques * automatic defect classification * software systems for flexible automatic inspection * applications of machine vision in microelectronics manufacturing, web and paper products, glass and steel inspection, food and agriculture, and pharmaceuticals. Papers emphasizing fundamental methods that are widely applicable to industrial inspection are especially welcome. All submissions will be peer reviewed. Please note that abstracts must be at least 500 words in length in order to receive full consideration. This conference is just one of nearly 30 conferences to be held at the EI'97 symposium. And EI'97 is just part of the larger Photonics West Symposium being held 8-14 February 1997, San Jose Convention Ctr., San Jose, California USA. TO OBTAIN ALL CALLS FOR PAPERS ELECTRONICALLY The URL for the web site with the calls is: http://www.spie.org/web/meetings/calls/pw97/pw97call_home.html by anonymous FTP (ftp://spie.org/meetings/calls/pw97*), or by e-mail file retrieval send a message to info-optolink-request@spie.org with the following in the message body: send [meetings.calls]pw97*} For a printed call for papers or other information: E-mail: pw97@spie.org Fax: 360/647-1445 Phone: 360/676-3290 Electronic Imaging '97 DEADLINES Paper Abstracts Due from Authors: 15 July 1996 Manuscripts Due from Authors: 13 January 1997 GUIDELINES FOR SUBMITTING AN ABSTRACT Send a 500 word abstract of your paper, by the appropriate deadline, in ONE of the following ways: >>mail (please mail 4 hard copies) to: IS&T/SPIE Electronic Imaging '97 SPIE, P.O. Box 10, Bellingham, WA 98227-0010 Shipping Address: 1000 20th Street, Bellingham, WA 98225 Telephone: 360/676-3290 (*) >>electronic mail in ASCII format to Internet abstracts@spie.org (Please send one submission per email message.) >>fax to SPIE at 360/647-1445 (Please send one submission per fax.) Be sure each abstract includes the following: 1. CONFERENCE CHAIR and CONFERENCE TITLE (submit to ONLY ONE conference) to which the abstract is submitted 2. AUTHOR LISTING (List principal author first) for each author: full name [first(given) last(family] and affiliation, mailing address, phone/fax numbers, email 3. ABSTRACT/PAPER TITLE 4. ABSTRACT TEXT: 500 words typed on white paper 5. KEYWORDS: maximum of 5 keywords 6. BRIEF BIOGRAPHY of the principal author: 50-100 words Please contact SPIE if you have any questions or require further information.