MACHINE VISION APPLICATIONS in INDUSTRIAL INSPECTION 1997

Conference Chairs: A. Ravishankar Rao, IBM Thomas J. Watson Research Ctr.;
Ning Chang, KLA Instruments Corp.

Machine vision systems can augment human vision capabilities in
repetitive or high-speed industrial inspection tasks or when precise
visual measurement and inspection are required. These systems improve
manufacturing productivity, quality, and compliance with product
standards, and thus provide a competitive advantage. Improvements in
machine vision hardware, algorithms, and software expand the range of
industrial processes to which this technology can be successfully
applied.

This conference brings together practitioners and researchers in
machine vision to share recent developments in computer vision
architectures, hardware, algorithms, and software for industrial
inspection tasks. Papers are solicited but not limited to the
following areas:
*    new or improved algorithms for industrial inspection
*    novel hardware designs for machine vision systems
*    robot vision and tracking
*    verification and identification
*    performance evaluation of algorithms
*    use of 3D or color imaging techniques
*    automatic defect classification
*    software systems for flexible automatic inspection
*    applications of machine vision in microelectronics manufacturing, web
     and paper products, glass and steel inspection, food and agriculture,
     and pharmaceuticals.

Papers emphasizing fundamental methods that are widely applicable to
industrial inspection are especially welcome. All submissions will be
peer reviewed. Please note that abstracts must be at least 500 words
in length in order to receive full consideration.

This conference is just one of nearly 30 conferences to be held at the EI'97
symposium. And EI'97 is just part of the larger Photonics West Symposium being
held 8-14 February 1997, San Jose Convention Ctr., San Jose,
California USA.

TO OBTAIN ALL CALLS FOR PAPERS ELECTRONICALLY
The URL for the web site with the calls is:

http://www.spie.org/web/meetings/calls/pw97/pw97call_home.html

by anonymous FTP
(ftp://spie.org/meetings/calls/pw97*),
or by e-mail file retrieval
send a message to info-optolink-request@spie.org with the following in the
message body:
send [meetings.calls]pw97*}

For a printed call for papers or other information:
E-mail: pw97@spie.org
Fax: 360/647-1445 
Phone: 360/676-3290

Electronic Imaging '97 DEADLINES
Paper Abstracts Due from Authors:
     15 July 1996

Manuscripts Due from Authors:
     13 January 1997

GUIDELINES FOR SUBMITTING AN ABSTRACT

Send a 500 word abstract of your paper, by the appropriate deadline, in ONE of
the following ways:

>>mail (please mail 4 hard copies) to:
     IS&T/SPIE Electronic Imaging '97
     SPIE, P.O. Box 10, Bellingham, WA  98227-0010
     Shipping Address: 1000 20th Street, Bellingham, WA  98225
     Telephone: 360/676-3290 (*)
>>electronic mail in ASCII format to Internet abstracts@spie.org
     (Please send one submission per email message.)
>>fax to SPIE at 360/647-1445 
     (Please send one submission per fax.)

Be sure each abstract includes the following:

1. CONFERENCE CHAIR and CONFERENCE TITLE (submit to ONLY ONE conference)
     to which the abstract is submitted
2. AUTHOR LISTING (List principal author first)
     for each author: full name [first(given) last(family] and affiliation,
     mailing address, phone/fax numbers, email
3. ABSTRACT/PAPER TITLE
4. ABSTRACT TEXT: 500 words typed on white paper
5. KEYWORDS: maximum of 5 keywords
6. BRIEF BIOGRAPHY of the principal author: 50-100 words
Please contact SPIE if you have any questions or require further information.