VIDEOMETRICS V Call For Papers Part of: SPIE's International Symposium on Optics, Imaging and Instrumentation SPIE Annual Meeting '97 25 July - 1 August, 1997 San Diego Convention Center San Diego, California, USA Program Committee: Sabry F. El-Hakim, Chairman (Canada) Hirofumi Chikatsu (Japan) Dieter Fritsch (Germany) Armin Gruen, (Switzerland) Henrik Haggren (Finland) Mark Shortis (Australia) Jim Walton (USA) This fifth conference on Videometrics addresses developments and applications of the state-of-the-art vision-based 3-D measurement and modeling technologies. The four previous Videometrics conferences were part of SPIE's Photonics East Symposia. The primary function of Videometrics is to obtain quantitative information about physical objects or site. This includes methods to accurately and automatically recover geometric and texture properties from not only traditional CCD cameras but also, among others, active 3-D laser scanners, digital interface/progressive scan CCD cameras, CCD cameras with onboard processing, high resolution digital still video, and integrated different types of data. Calibration, performance evaluation, and multi-view registration of sensors and systems for measurement and modeling-related applications are some of the important issues. Dimensional inspection, quality control, and dynamic tracking are some of the established applications of Videometrics. However, applications requiring 3-D modeling of sites, such as virtual reality applications, are becoming of interest. An important objective of this conference is to bring together machine vision specialists, photogrammetrists, system designers, and potential users, particularly those with high accuracy and speed requirements, to discuss and exchange ideas on the above issues. Papers are solicited in the following and related areas: o successfully demonstrated image metrology and modeling applications o acquisition, processing, analysis, and display of 3-D data o object and site modeling techniques for CAD and virtual reality o high speed object tracking and extraction of 3-D models o integration of various sensor data for metrology and modeling o rigorous and practical camera and system calibration o accuracy and performance evaluation of sensors and systems Abstract due: December 9, 1996 Manuscript Due: April 28, 1996 (on-site proceedings) Abstracts may be submitted: a) in ASCII format via e-mail to abstracts@spie.org b) by fax (1 copy) to SPIE at 360/647-1445, or c) by mail (4 copies) to: SPIE Annual Meeting '97 SPIE, P.O.Box 10, Bellingham, WA 98227-0010, USA Abstracts should include: 1. The title 2. Full names and affilations of authors 3. A mailing address, phone, FAX, and E-Mail address for each author 4. Abstract text (250 words) 5. A brief biography of the principal author 6. Oral or poster presentation Please indicate that the abstract is being submitted for inclusion in: "Videometrics V (El-Hakim)"