VIDEOMETRICS V                                       
Call For Papers

Part of: SPIE's International Symposium on
             Optics, Imaging and Instrumentation
SPIE Annual Meeting '97
25 July - 1 August, 1997
San Diego Convention Center
San Diego, California, USA

Program Committee:

Sabry F. El-Hakim, Chairman (Canada) 
Hirofumi Chikatsu (Japan)
Dieter Fritsch  (Germany)
Armin Gruen, (Switzerland)
Henrik Haggren (Finland)
Mark Shortis (Australia)
Jim Walton (USA)
                        
This fifth conference on Videometrics addresses developments and
applications of the state-of-the-art vision-based 3-D measurement and
modeling technologies. The four previous Videometrics conferences were
part of SPIE's Photonics East Symposia. The primary function of
Videometrics is to obtain quantitative information about physical
objects or site. This includes methods to accurately and automatically
recover geometric and texture properties from not only traditional CCD
cameras but also, among others, active 3-D laser scanners, digital
interface/progressive scan CCD cameras, CCD cameras with onboard
processing, high resolution digital still video, and integrated
different types of data. Calibration, performance evaluation, and
multi-view registration of sensors and systems for measurement and
modeling-related applications are some of the important issues.
Dimensional inspection, quality control, and dynamic tracking are some
of the established applications of Videometrics. However, applications
requiring 3-D modeling of sites, such as virtual reality applications,
are becoming of interest. An important objective of this conference is
to bring together machine vision specialists, photogrammetrists,
system designers, and potential users, particularly those with high
accuracy and speed requirements, to discuss and exchange ideas on the
above issues.

Papers are solicited in  the following and related areas:

o successfully demonstrated image metrology and modeling applications
o acquisition, processing, analysis, and display of 3-D data
o object and site modeling techniques for CAD and virtual reality
o high speed object tracking and extraction of 3-D models
o integration of various sensor data for metrology and modeling
o rigorous and practical camera and system calibration
o accuracy and performance evaluation of sensors and systems

Abstract due: December 9, 1996
Manuscript Due: April 28, 1996  (on-site proceedings)

Abstracts may be submitted:
a) in ASCII format via e-mail to abstracts@spie.org
b) by fax (1 copy) to SPIE at 360/647-1445, or
c) by mail (4 copies) to:
SPIE Annual Meeting '97
SPIE,
P.O.Box 10,
Bellingham, WA 98227-0010, USA

Abstracts should include:
1. The title
2. Full names and affilations of authors
3. A mailing address, phone, FAX, and E-Mail address for each author
4. Abstract text (250 words)
5. A brief biography of the principal author
6. Oral or poster presentation

Please indicate that the abstract is being submitted for inclusion in:

"Videometrics V (El-Hakim)"