Machine Vision Applications in Industrial Inspection 1998 Conference Date: Jan 26-30, 1998 Location: San Jose, California Conference Chairs: A. Ravishankar Rao, IBM Thomas J. Watson Research Ctr.; Ning Chang, KLA Instruments Corp. Program Committee: Joon Han POSTECH, Pohang, Korea John Jordan Tencor Instruments Kenneth Tobin Oak Ridge National Laboratory, Tennessee Automated machine vision systems are in wide use in industrial applications for guidance and inspection. Almost all semiconductor and electronic manufacturing equipment include machine vision systems to perform essential tasks such as alignment and positioning. Furthermore, there are numerous innovative methods of adding machine vision systems to manufacturing processes to improve productivity, quality, and compliance with product standards, and thus provide a competitive advantage. Improvements in machine vision hardware, algorithms, and software expand the range of industrial processes to which this technology can be successfully applied. This conference brings together practitioners and researchers in machine vision to share recent developments in computer vision architectures, hardware, algorithms, and software for industrial inspection tasks. Papers emphasizing the integration of machine vision systems into the manufacturing infrastructure are especially welcome. Papers are solicited but not limited to the following areas: * new or improved algorithms for industrial inspection * novel hardware designs for machine vision systems * robot vision and tracking * verification and identification * performance evaluation of algorithms * use of 3D or color imaging techniques * software systems for flexible automatic inspection * applications of machine vision in microelectronics manufacturing, web and paper products, glass and steel inspection, food and agriculture, and pharmaceuticals. * machine learning/feature analysis techniques, e.g. automatic defect classification * use of machine vision information for process control/diagnosis/ trend analysis/preventive maintenance * case studies of the impact of machine vision in manufacturing All submissions will be peer reviewed. Please note that abstracts must be at least 500 words in length in order to receive full consideration. Deadline for submssions: 30 June, 1997 Please visit the SPIE Web site, http://www.spie.org Click on Photonics West Call for Papers Electronic Imaging, EI 98 Submissions and fill out the online submission form for your abstracts. In addition, if you need to send a fax, you may do so at number 1-360-647-1445. Please indicate the conference, Electronic Imaging, Machine Vision and Applications.