Machine Vision Applications in Industrial Inspection 1998

 Conference Date: Jan 26-30, 1998
 Location:  San Jose, California
 
 Conference Chairs: 
 A. Ravishankar Rao, IBM Thomas J. Watson Research Ctr.;
 Ning Chang, KLA Instruments Corp.
 
 Program Committee: 
 Joon Han         POSTECH, Pohang, Korea
 John Jordan      Tencor Instruments
 Kenneth Tobin    Oak Ridge National Laboratory, Tennessee
 
Automated machine vision systems are in wide use in industrial
applications for guidance and inspection.  Almost all semiconductor
and electronic manufacturing equipment include machine vision systems
to perform essential tasks such as alignment and positioning.
Furthermore, there are numerous innovative methods of adding machine
vision systems to manufacturing processes to improve productivity,
quality, and compliance with product standards, and thus provide a
competitive advantage. Improvements in machine vision hardware,
algorithms, and software expand the range of industrial processes to
which this technology can be successfully applied.
 
This conference brings together practitioners and researchers in
machine vision to share recent developments in computer vision
architectures, hardware, algorithms, and software for industrial
inspection tasks.  Papers emphasizing the integration of machine
vision systems into the manufacturing infrastructure are especially
welcome.
 
Papers are solicited but not limited to the following areas:
 *    new or improved algorithms for industrial inspection
 *    novel hardware designs for machine vision systems
 *    robot vision and tracking
 *    verification and identification
 *    performance evaluation of algorithms
 *    use of 3D or color imaging techniques
 *    software systems for flexible automatic inspection
 *    applications of machine vision in microelectronics manufacturing, web
      and paper products, glass and steel inspection, food and agriculture,
      and pharmaceuticals.
 *    machine learning/feature analysis techniques, e.g. automatic defect 
      classification
 *    use of machine vision information for process control/diagnosis/
      trend analysis/preventive maintenance
 *    case studies of the impact of machine vision in manufacturing
 
All submissions will be peer reviewed. Please note that abstracts must
be at least 500 words in length in order to receive full
consideration.
 
Deadline for submssions: 30 June, 1997
 
Please visit the SPIE Web site, http://www.spie.org
Click on Photonics West Call for Papers
         Electronic Imaging, EI 98
         Submissions
and fill out the online submission form for your abstracts.  In
addition, if you need to send a fax, you may do so at number
1-360-647-1445. Please indicate the conference, Electronic Imaging,
Machine Vision and Applications.