CALL FOR PAPERS
                     
                   EUROPTO'99 Conference on
 Polarization and Colour Techniques in Industrial Inspection
 
 	      17-18 June 1999, Munich, Germany
 
 (part of EOS/SPIE Symposium on Industrial Laser and Inspection)
                      
 IMPORTANT DATES:
 Abstracts are due by 27 November 1998
 Manuscripts are due by 3 May 1999
 
 CONFERENCE CHAIRS:
 Elzbieta Marszalec, VTT (Finland), mailto:elzbieta.marszalec@vtt.fi
 Emanuele Trucco, Heriot-Watt University (UK), mailto:mtc@cee.hw.ac.uk
 
 PAPER SUBMISSION:
 See below for up-to-date information. Full information soon available
 at the EUROPTO site: http://www.europto.org
 
 PROGRAMME COMMITTEE:
 David J Braunegg, The MITRE Corporation (USA);
 Michael Brill, David Sarnoff Rsearch Center (USA);
 Olle Hagman, Lulea Univ. of Tech. (Sweden);
 Glenn Healey, Univ. of California (USA);
 B Kosmowski, Tech. Univ. of Gdansk (Poland);
 R Massen, Massen Mach.Vision Systs. (Germany);
 Volker Mueller, MAZ Hamburg (Germany/China);
 Paolo Nesi, Univ. of Florence (Italy);
 J Parkkinen, Lappeenranta Univ. of Tech. (Finland);
 Olli Silven, Univ. of Oulu (Finland);
 Alessandro Verri, Univ. of Genoa (Italy);
 Andrew M Wallace, Heriot-Watt Univ. (UK);
 Lawrence B Wolff, Johns Hopkins Univ. (USA)
 
 INVITED SPEAKERS:
 R. Massen, Massen Machine Vision Systems (Germany)
 Lawrence B. Wolff, Johns Hopkins University (USA)
 
 CONFERENCE TOPICS
 Recent developments in the theory and technology of colour and
 polarization analysis, as well related advancements in hardware and
 software for machine vision applications, are making colour and
 polarization increasingly important tools for industrial inspection.
 Neither techniques, however, can be considered consolidated technologies
 for practical purposes. This conference aims to present the latest
 solutions for colour and polarization analysis and measurement, their
 applications, and to discuss the requirements of colour and
 polarization-based inspection systems operating in real industrial
 environments.
 
 Papers reporting novel work on (but not limited to) the following topics
 are solicited:
 
 RGB vs multi-channel colour measurements
 Colour-based inspection systems and quality control
 Colour display technologies
 Colour physics and analysis
 Colour science for inspection applications
 Colour representation: colour spaces and systems
 Human vision vs industrial colour inspection
 Colour surfaces: texture and colour
 Colorimetric calibration
 Polarization-based material discrimination
 Polarization techniques for defect detection
 Polarization-based surface analysis
 Polarization systems in machine vision
 Shape from polarization
 Polarization techniques in laser scanning
 
 The conference will include a POSTER SESSION.
 
 
 Abstract Submission
 
 YOUR ABSTRACT SHOULD INCLUDE THE FOLLOWING:
 
 1. SUBMIT TO: Industrial Lasers & Inspectionhttp://www.europto.org