CALL FOR PAPERS
EUROPTO'99 Conference on
Polarization and Colour Techniques in Industrial Inspection
17-18 June 1999, Munich, Germany
(part of EOS/SPIE Symposium on Industrial Laser and Inspection)
IMPORTANT DATES:
Abstracts are due by 27 November 1998
Manuscripts are due by 3 May 1999
CONFERENCE CHAIRS:
Elzbieta Marszalec, VTT (Finland), mailto:elzbieta.marszalec@vtt.fi
Emanuele Trucco, Heriot-Watt University (UK), mailto:mtc@cee.hw.ac.uk
PAPER SUBMISSION:
See below for up-to-date information. Full information soon available
at the EUROPTO site: http://www.europto.org
PROGRAMME COMMITTEE:
David J Braunegg, The MITRE Corporation (USA);
Michael Brill, David Sarnoff Rsearch Center (USA);
Olle Hagman, Lulea Univ. of Tech. (Sweden);
Glenn Healey, Univ. of California (USA);
B Kosmowski, Tech. Univ. of Gdansk (Poland);
R Massen, Massen Mach.Vision Systs. (Germany);
Volker Mueller, MAZ Hamburg (Germany/China);
Paolo Nesi, Univ. of Florence (Italy);
J Parkkinen, Lappeenranta Univ. of Tech. (Finland);
Olli Silven, Univ. of Oulu (Finland);
Alessandro Verri, Univ. of Genoa (Italy);
Andrew M Wallace, Heriot-Watt Univ. (UK);
Lawrence B Wolff, Johns Hopkins Univ. (USA)
INVITED SPEAKERS:
R. Massen, Massen Machine Vision Systems (Germany)
Lawrence B. Wolff, Johns Hopkins University (USA)
CONFERENCE TOPICS
Recent developments in the theory and technology of colour and
polarization analysis, as well related advancements in hardware and
software for machine vision applications, are making colour and
polarization increasingly important tools for industrial inspection.
Neither techniques, however, can be considered consolidated technologies
for practical purposes. This conference aims to present the latest
solutions for colour and polarization analysis and measurement, their
applications, and to discuss the requirements of colour and
polarization-based inspection systems operating in real industrial
environments.
Papers reporting novel work on (but not limited to) the following topics
are solicited:
RGB vs multi-channel colour measurements
Colour-based inspection systems and quality control
Colour display technologies
Colour physics and analysis
Colour science for inspection applications
Colour representation: colour spaces and systems
Human vision vs industrial colour inspection
Colour surfaces: texture and colour
Colorimetric calibration
Polarization-based material discrimination
Polarization techniques for defect detection
Polarization-based surface analysis
Polarization systems in machine vision
Shape from polarization
Polarization techniques in laser scanning
The conference will include a POSTER SESSION.
Abstract Submission
YOUR ABSTRACT SHOULD INCLUDE THE FOLLOWING:
1. SUBMIT TO: Industrial Lasers & Inspectionhttp://www.europto.org