EOS/SPIE CONFERENCE ON POLARISATION AND COLOUR TECHNIQUES IN INDUSCTRIAL = INSPECTION, MUNICH, JUNE 14-18 1999 (Co-located with the Laser Munich Show) Recent developments in the theory and technology of colour and = polarisation analysis, as well related advancements in hardware and = software for machine vision applications, are making colour and = polarisation increasingly important tools for industrial inspection. = Neither techniques, however, can be considered consolidated technologies = for practical purposes. This conference aims to present the latest = solutions for colour and polarisation analysis and measurement, their = applications, and to discuss the requirements of colour and = polarisation-based inspection systems operating in real industrial = environments. On behalf of SPIE [The International Society for Optical Engineering] = and EOS [The European Optical Society] it is my pleasure to invite you = to contribute a paper for this meeting. A number of distinguished = speakers have already accepted invitations to speal at this event. We = believe that this meeting will be a very significant one in this = fast-developing area. We sollicit your abstract untill 15 December. Please send it by e-mail = to europto@associationhq.com or by fax (+32-2-7431550) specifying your = preference for an oral or poster presentation. (More information about abstract submission you will be able to find on = our website http://www.europto.org) Papers are sollicited in all areas of Polarisation and Colour Techniques = including: RGB vs multi-channel colour measurements Colour-based inspection systems and quality control Colour display technologies Colour physics and analysis Colour science for inspection applications Colour representation: colour spaces and systems Human vision vs industrial colour inspection Colour surfaces: texture and colour Colorimetric calibration Polarisation-based material discrimination Polarisation techniques for defect detection Polarisation-based surface analysis Polarisation systems in machine vision Shape from polarisation Polarisation techniques in laser scanning We look forward to seeing you in Munich in June 1999!! Chairs: Elzbieta Marszalec, VTT Information Technology, Finland Emanuele Trucco, Heriot-Watt University, UK