EOS/SPIE CONFERENCE ON POLARISATION AND COLOUR TECHNIQUES IN INDUSCTRIAL =
INSPECTION, MUNICH, JUNE 14-18 1999
(Co-located with the Laser Munich Show)
 
Recent developments in the theory and technology of colour and =
polarisation analysis, as well related advancements in hardware and =
software for machine vision applications, are making colour and =
polarisation increasingly important tools for industrial inspection. =
Neither techniques, however, can be considered consolidated technologies =
for practical purposes. This conference aims to present  the latest =
solutions for colour and polarisation analysis and measurement, their =
applications, and to discuss the requirements of colour and =
polarisation-based inspection systems operating in real industrial =
environments.
 
On behalf of SPIE [The International Society for Optical Engineering] =
and EOS [The European Optical Society] it is my pleasure to invite you =
to contribute a paper for this meeting. A number of distinguished =
speakers have already accepted invitations to speal at this event. We =
believe that this meeting will be a very significant one in this =
fast-developing area.
 
We sollicit your abstract untill 15 December. Please send it by e-mail =
to europto@associationhq.com or by fax (+32-2-7431550) specifying your =
preference for an oral or poster presentation.
(More information about abstract submission you will be able to find on =
our website http://www.europto.org)
 
Papers are sollicited in all areas of Polarisation and Colour Techniques =
including:
RGB vs multi-channel colour measurements
Colour-based inspection systems and quality control
Colour display technologies
Colour physics and analysis
Colour science for inspection applications
Colour representation: colour spaces and systems
Human vision vs industrial colour inspection
Colour surfaces: texture and colour
Colorimetric calibration
Polarisation-based material discrimination
Polarisation techniques for defect detection
Polarisation-based surface analysis
Polarisation systems in machine vision
Shape from polarisation
Polarisation techniques in laser scanning
 
We look forward to seeing you in Munich in June 1999!!
 
Chairs:
Elzbieta Marszalec, VTT Information Technology, Finland
Emanuele Trucco, Heriot-Watt University, UK