ANNOUNCEMENT AND CALL FOR PARTICIPATION Second Workshop on Empirical Evaluation Methods in Computer Vision In conjunction with ECCV 2000, June 2000 --- Dublin, Ireland http://www.nist.gov/itl/div894/vip/2eecv/2nd_eval_methods.html MOTIVATION In order for computer vision to mature from both scientific and industrial points of view, we must have objective methods for evaluating algorithms. Towards this end, we are organizing the Second Workshop of Empirical Evaluation of Methods in Computer Vision. As with the first workshop, one of the goals of the workshop is to bring together researchers in the computer vision community to present papers and discuss methods for empirical evaluation of vision algorithms. We hope to foster interaction and discussion on this subject, and to learn from related fields that have successfully used empirical evaluation methods. PROGRAM The workshop program will include tutorials, invited speakers, and presentations of contributed papers. The emphasis for the invited speakers will be on methods for statistically analyzing performance results; i.e., when is the difference in performance between two algorithms statistically significant. Contributed papers will be reviewed based on content relevant to the theme of the workshop, with an emphasis on sound empirical methods and results. Relevant topics include, but are not limited to: methods / tools / databases for performance evaluation, empirical comparison of different algorithms for vision problems, evaluation of medical imaging algorithms in clinical settings, evaluation of algorithms for industrial applications, and statistical analysis of algorithm performance results. PAPER SUBMISSION Papers should be submitted no later than 10 February 2000. Submission are to be made electronically (ftp://ftp.nada.kth.se/CVAP/users/hic/PEW). See workshop webpage for details. Each submission should have a cover page which includes the address, phone number, fax number, and e-mail address of the corresponding author. Papers are limited to 25 double-spaced pages (12 pt, 1 inch margins), including figures, references, etc. Accepted papers will be published as part of an edited book or in a proceedings volume. Workshop Chairs: Henrik Christensen, hic@nada.kth.se, KTH Stockholm Jonathon Phillips, jonathon@nist.gov, NIST Organizing Committee: Kevin Bowyer, Univ of South Florida Horst Bunke, Univeristat Bern Atul Chhabra, Bell Atlantic Adrian Clark, University of Essex Patric Courtney, Visual Automation Ltd, UK Sandor Der, U.S. Army Research Lab. James Duncan, Yale University Stan Dunn, Rutgers University Bob Fisher, University of Edinburgh Patrick Flynn, Ohio State U. Wolfgang Forstner, Universitat Bonn Adam Hoover, Clemson University Philip Kegelmeyer, Sandia Josef Kittler, University of Surrey Claus Madsen, Aalborg University Peter Meer, Rutgers University Jose Santos Victor, Instituto Superior Technico Sudeep Sarker, Univ of South Florida Carsten Steger, Tech. Uni. Munchen