ANNOUNCEMENT AND CALL FOR PARTICIPATION
 
                                Second Workshop on
                 Empirical Evaluation Methods in Computer Vision
 
       In conjunction with ECCV 2000, June 2000 --- Dublin, Ireland
         http://www.nist.gov/itl/div894/vip/2eecv/2nd_eval_methods.html
 
 MOTIVATION
 
 In order for computer vision to mature from both scientific and
 industrial points of view, we must have objective methods for evaluating
 algorithms.  Towards this end, we are organizing the Second Workshop of
 Empirical Evaluation of Methods in Computer Vision.  As with the first
 workshop, one of the goals of the workshop is to bring together
 researchers in the computer vision community to present papers and
 discuss methods for empirical evaluation of vision algorithms.  We hope
 to foster interaction and discussion on this subject, and to learn from
 related fields that have successfully used empirical evaluation methods. 
 
 PROGRAM
 
 The workshop program will include tutorials, invited speakers, and
 presentations of contributed papers.  The emphasis for the invited
 speakers will be on methods for statistically analyzing performance
 results; i.e., when is the difference in performance between two
 algorithms statistically significant. 
 
 Contributed papers will be reviewed based on content relevant to the
 theme of the workshop, with an emphasis on sound empirical methods and
 results.  Relevant topics include, but are not limited to:
   methods / tools / databases for performance evaluation,
   empirical comparison of different algorithms for vision problems,
   evaluation of medical imaging algorithms in clinical settings,
   evaluation of algorithms for industrial applications,
   and statistical analysis of algorithm performance results.
 
 PAPER SUBMISSION
 
 Papers should be submitted no later than 10 February 2000.  Submission
 are to be made electronically (ftp://ftp.nada.kth.se/CVAP/users/hic/PEW).
 See workshop webpage for details.
 
 Each submission should have a cover page which includes the address,
 phone number, fax number, and e-mail address of the corresponding
 author.  Papers are limited to 25 double-spaced pages (12 pt, 1 inch
 margins), including figures, references, etc.  Accepted papers will be
 published as part of an edited book or in a proceedings volume. 
 
 Workshop Chairs:
   Henrik Christensen, hic@nada.kth.se, KTH Stockholm
   Jonathon Phillips, jonathon@nist.gov, NIST
 
 Organizing Committee:
   Kevin Bowyer, Univ of South Florida
   Horst Bunke, Univeristat Bern
   Atul Chhabra, Bell Atlantic
   Adrian Clark, University of Essex
   Patric Courtney, Visual Automation Ltd, UK
   Sandor Der, U.S. Army Research Lab.
   James Duncan, Yale University
   Stan Dunn, Rutgers University
   Bob Fisher, University of Edinburgh
   Patrick Flynn, Ohio State U.
   Wolfgang Forstner, Universitat Bonn
   Adam Hoover, Clemson University
   Philip Kegelmeyer, Sandia
   Josef Kittler, University of Surrey
   Claus Madsen, Aalborg University
   Peter Meer, Rutgers University
   Jose Santos Victor, Instituto Superior Technico
   Sudeep Sarker, Univ of South Florida
   Carsten Steger, Tech. Uni. Munchen