FINAL CALL FOR PAPERS
 
 Machine Vision Applications in Industrial Inspection XI (EI12)
 conference part of 15th annual Symposium on Electronic Imaging: Science
 and Technology
 20-24 January 2003, Santa Clara, California, USA
 
 http://electronicimaging.org/call/03/submitAbstract/index.cfm?fuseaction=EI12
 
 Machine vision can be described as the integration of imaging devices,
 computers, algorithms, and robotics to automate manufacturing
 inspection, characterization, and control. Today's high-speed, complex
 manufacturing systems require the development of automation technologies
 that can efficiently collect data, use historical information to provide
 context, and generate process knowledge. Intelligently designed systems
 can use this knowledge for automatic characterization and control of
 product quality and the manufacturing process. In this regard, machine
 vision technology continues to provide new and innovative opportunities
 to automate manufacturing systems. 
 
 The semiconductor and electronic industries are excellent examples of
 the successful application of machine vision technology today. Almost
 all semiconductor and electronic manufacturing equipment include machine
 vision systems to perform essential tasks such as alignment and
 positioning, and information gathering tasks such as automatic defect
 and signature classification for yield management. Many other industries
 are witnessing a rapid adoption of this technology including aluminum,
 forest products, textiles, glass, steel, metal casting, and chemicals.
 There are numerous innovative methods for adding machine vision systems
 to manufacturing processes to improve productivity, quality, and
 compliance with product standards, thus providing a competitive
 advantage. This conference brings together practitioners and researchers
 in machine vision to share recent developments in computer vision
 architectures, hardware, algorithms, and software for industrial
 inspection, characterization, and control. Papers emphasizing the
 integration of machine vision systems into the manufacturing
 infrastructure are especially welcome. 
 
 Papers are solicited in four broad topical areas:
     image processing and metrology
     measurement of color and appearance
     feature analysis and pattern recognition
     machine vision systems integration and process characterization.
 
 Individual papers are solicited but not limited to the following topics:
     new or improved algorithms for industrial inspection
     novel hardware designs for machine vision systems
     robot vision and tracking
     performance evaluation of algorithms
     use of 3D or color imaging techniques
     industrial applications of machine vision
     food, agriculture, and pharmaceuticals applications of machine
           vision
     machine learning, pattern recognition, and feature analysis
           techniques
     use of machine vision information for process control and diagnosis,
           trend analysis, and preventive maintenance
     case studies of the impact of machine vision in manufacturing.
 
 All submissions will be peer reviewed. Please note that abstracts must
 be at least 500 words in length in order to receive full consideration.
 
 Conference Dates:    20–24 January  2003
 Abstract Due:        24    June     2002
 Final Summaries Due: 18    December 2002
 Manuscripts Due:     23    December 2002