2nd IEEE Workshop on Geometric, Variational and Level Set Methods in CV Beijing, China , October 2003 http://www.scr.siemens.com/vlsm03 In Conjunction with the IEEE International Conference In Computer Vision Scope: During the last twenty years a wide variety of mathematical and computational frameworks have been proposed to deal with computer vision applications. More recently many Computer Vision researchers have started to pay more attention to the use of variational, geometric, lagrangian and level set approaches to solve vision problems. This workshop focuses on these novel mathematical techniques and their applications to Computer Vision problems. Topics of interest include, but are not limited to, the following: Techniques: Differential Geometry & Geometric Flows, PDE-Level Set, Langrangian & Variational Methods Statistical Methods & Energy-minimization Approaches Applications: Image Registration/Segmentation, Curve/Surface/Volume Registration Stereo Reconstruction & Implicit Surfaces, Snakes, Splines, and Deformable Models PDE-based Methods of Image Analysis, Surface and Volume Models, Feature extraction Applications Deadlines: Deadline for paper submission May 15th, 2003- Notification of acceptance June 30th, 2003 Deadline for final paper July 15th, 2003 - Workshop October 12-13 (prior to ICCV), 2003 Submission Guidelines: Electronic, soon to be annouched on the WWW page Organizing Committee: Olivier Faugeras INRIA, Nikos Paragios Siemens Corporate Research Rachid Deriche INRIA Demetri Terzopoulos Programme Committee: Luis Alvarez University of Las Palmas, Spain Nicholas Ayache INRIA Sophia Antipolis, France Michel Barlaud University of Nice, France Vincent Caselles University of Pompeu Fabra, Spain Tony Chan University of California, Los Angeles, United States Yunmei Chen University of Florida, United States Sven Dickinson University of Toronto, Canada Lewis Griffin King College, United Kingdom Marie-Pierre Jolly Siemens Corporate Research, US Ron Kimmel Technion University, Israel Georges Koepfler University of Paris 5, France Petros Maragos National Technical University of Athens, Greece Dimitris Metaxas Rutgers University, United States Lionel Moisan Ecole Normale Superiore de Cachan, France Peter Olver University of Minnesota, United States Stanley Osher University of California, Los Angeles, United States Guillermo Sapiro University of Minnesota, United States Christoph Schnoerr University of Mannheim, Germany Kaleem Siddiqi McGill University, Canada Stefano Soatto University of California, Los Angeles, United States Nir Sochen University of Tel-Aviv, Israel Allen Tannenbaum Georgia Institute of Technology, United States Anthony Yezzi Georgia Institute of Technology, United States Laurent Younes Ecole Normale Superiore, France Baba Vemuri University of Florida, United States Joachim Weickert University of Saarland, Germany