http://vlsm05.enpc.fr 3rd IEEE Workshop on Variational, Geometric & Level Set Methods In Conjunction with the 10th IEEE International Conference in Computer Vision October 15th, 2005 (tentative), Beijing, China DATES: Intention of submission May 15th, 2005 Deadline for paper submission May 30th, 2005 Notification of acceptance July 15th, 2005 Deadline for final paper July 22nd, 2005 Workshop October 15th, 2005 Journal submission (provisional) January, 2006 SCOPE: During the last twenty years a wide variety of mathematical and computational frameworks have been proposed to deal with computer vision applications. More recently many Computer Vision researchers have started to pay more attention to the use of variational, geometric, lagrangian and level set approaches to solve vision problems. Such approaches are widely used nowadays and attempt to provide original solutions to a large variety of applications. This workshop focuses on these novel mathematical techniques and their applications to Computer Vision problems. IMPORTANT INFORMATION: Selected Papers from the Workshop will appear in a special issue of the International Journal of Computer Vision The Imaging and Visualization Department of Siemens Corporate Research will sponsor the BEST student paper award (1,000$) SUBMISSION TOPICS: Differential Geometry & Geometric Flows , PDE-Level Set, Langrangian & Variational Methods, Statistical Methods & Energy-minimization Approaches, Image Registration/Segmentation , Curve/Surface/Volume Registration, Stereo Reconstruction & Implicit Surfaces, Snakes, Splines, and Deformable Models, PDE-based Methods of Image Analysis, Surface and Volume Models, Feature extraction CHAIRS: Tony Chan , Program Chair, University of California Los Angelles, USA Olivier Faugeras, General Chair, INRIA, France Nikos Paragios, Organizer & General Co-Chair, Ecole Nationale des Ponts et Chaussees, France Christoph Schnoerr, Program Chair, University of Mannheim, Germany COMMITTEE: Luis Alvarez, University of Las Palmas, Spain Benedicte Bascle, France Telecom R&D, France Andrew Blake Microsoft Research, UK Alfred Bruckstein Technion University, Israel Vincent Caselles University of Pompeu Fabra, Spain Yunmei Chen University of Florida, USA Laurent Cohen University of Paris - Dauphine, France Rachid Deriche INRIA, France Eric Grimson Massachusetts Institute of Technology, USA Frederic Guichard DxO, Enhancing Image Quality, France Marie-Pierre Jolly Siemens Corporate Research, United States Ioannis Kakadiaris University of Houston, USA Renaud Keriven Ecole Nationale des Ponts et Chaussees Ron Kimmel Technion University, Israel Hamid Krim University of North Carolina, USA Petros Maragos National Technical University of Athens, Greece James W. MacLean University of Toronto, Canada Dimitris Metaxas Rutgers University, USA Mads Nielsen University of Copenhagen, Denmark Mila Nikolova Ecole Normale Superiore de Cachan , France Stanley Osher University of California, Los Angeles, USA Dimitris Samaras State University of New York, Stony Brook, USA Guillermo Sapiro University of Minnesota, United States Nir Sochen University of Tel-Aviv, Israel George Tziritas University of Crete, Greece Allen Tannenbaum Georgia Institute of Technology, USA Jean-Philippe Thiran EPFL, Switzerland Anthony Yezzi Georgia Institute of Technology, USA Baba Vemuri University of Florida, United States Luminita Vese, University of California Los Angelles, USA Joachim Weickert University of Saarland, Germany James Williams Siemens Corporate Research, USA Hongkai Zhao University of California, Irvine Steven Zucker Yale University, USA