ECV 2006 CALL FOR PAPERS 2nd IEEE Workshop on Embedded Computer Vision New York, NY, June 18, 2006 (Held in conjunction with IEEE CVPR 2006) http://www.ece.umd.edu/DSPCAD/ecv06 ------------------------------------------------------------------------ Recent years have witnessed a dramatic increase in the use of computer vision in embedded systems. Computer vision was successfully used, for example, in mission-critical systems such as the landing of the recent rovers on Mars, and in computer-aided surgery. Computer vision is widely used also in industrial embedded systems, taking part in production and inspection processes. Cameras find their way into everyday appliances such as cell phones, PDA^Òs, presentation appliances, and vehicles. Cameras themselves are becoming "smarter," gaining capabilities for processing the acquired images inside the camera. Furthermore, distributed smart camera systems, which integrate computer vision algorithms with embedded processing and computer networking techniques, are enabling major advances in areas such as surveillance and human identification. Traditionally, different embedded computer vision domains, such as computer aided-surgery and surveillance were treated separately due to the different nature of the domains. However, these domains share many common problems related to their real-time, embedded-system characteristics. The Embedded Computer Vision Workshop (ECVW) aims to bring together researchers working on computer vision problems that share embedded system characteristics. Particularly, the workshop will address the following questions: -- What are the current research problems and the applications within the computer vision domain that are specific to embedded systems --- for example, algorithms for efficient utilization of embedded processing architectures for computer vision, and conversely, architectures and design methods for effectively supporting embedded computer vision systems? -- What are the specific issues in the embedded systems domain that are relevant to computer vision (for example, meeting constraints on real-time performance, power consumption, and memory requirements in embedded computer vision systems)? Research papers are solicited in, but not limited to, the following topics: -- Analysis of computer vision problems that are specific to embedded systems. -- Analysis of embedded systems problems that are specific to computer vision. -- Verification methods for mission-critical embedded computer vision systems. -- New trends in programmable digital signal processors and their computational models. -- Reconfigurable processors and computer vision. -- Embedded multiprocessor systems and design methods. -- Hybrid / distributed models and architectures for embedded computer vision. -- Applications of embedded computer vision. -- Development tools for computer vision applications aimed at embedded systems This workshop is the second in its series. The First Workshop on Embedded Computer Vision(http://www.scr.siemens.com/ecv05/) was held in 2005 in conjunction with CVPR 2005, and was very successful. Selected papers from the first workshop are being published in a special issue of the EURASIP Journal on Embedded Systems, and we intend to pursue a similar special journal issue following ECVW 2006. Reviewing will be blind circular. By submitting a paper, each author agrees to review up to three other submissions. In addition, a member of the program committee will also review each paper. This procedure has produced quality, useful reviews in previous workshops. As reviewers, authors must comply with the reviewing schedule below. IMPORTANT DATES: -- Paper submission: March 7, 2006 -- Notification to the authors: April 17, 2006 -- Receipt of camera ready copy:April 24, 2006 -- Workshop: June 18, 2006 CONFERENCE ORGANIZERS: GENERAL CHAIRS: * Rama Chellappa, University of Maryland * Wayne Wolf, Princeton University Program Chair: * Shuvra Bhattacharyya, University of Maryland Program Committee: Shai Avidan, Mitsubishi Electric Research Labs; Neal Bambha, U. S. Army Research Laboratory; Moshe Ben-Ezra, Siemens Corporate Research; Shuvra Bhattacharyya, University of Maryland; Terrance Boult, University of Colorado at Colorado Springs; Rama Chellappa, University of Maryland; Ed. F Deprettere, Leiden Embedded Research Center, Leiden University; Branislav Kisacanin, Delphi Corporation; Kurt Konolige, Artificial Intelligence Center, SRI International; Anurag Mittal, Indian Institute of Technology, Madras; Burak Ozer, Verificon Corporation; Visvasathan Ramesh, Siemens Corporate Research Inc.; Raj Rajkumar, Carnegie Mellon University; Gideon Stein, MobilEye Vision Technologies Ltd.; Yun-Ting Lin, ActivEye Inc.; Wayne Wolf, Princeton University.