Conference Electronic Imaging / Wavelet Applications in Industrial Processing VI
San Jose, CA USA
18-22 January 2009

Part of program track on Image Processing

Conference Chairs:
Frederic Truchetet, Univ. de Bourgogne (France); Olivier Laligant, Univ. de Bourgogne (France)
Program Committee:
Patrice Abry, École Normale Supérieure de Lyon (France); Jean-Pierre
Antoine, Univ. Catholique de Louvain (Belgium); Radu V. Balan, Siemens
Corporate Research; Atilla M. Baskurt, Univ. de Claude Bernard Lyon I
(France); Amel Benazza-Benyahia, Ecole Supérieure des Communications
de Tunis (Tunisia); Albert Bijaoui, Observatoire de la Côte d'Azur
(France); Laurent C. Duval, Institut Français du Pétrole (France);
Seiji Hata, Kagawa Univ. (Japan); William S. Hortos, Associates in
Communication Engineering Research and Technology; Jacques Lewalle,
Syracuse Univ.; Wilfried R. Philips, Univ. Gent (Belgium); Alexandra
Pizurica, Univ. Gent (Belgium); Guoping Qiu, The Univ. of Nottingham
(United Kingdom); Hamed Sari-Sarraf, Texas Tech Univ.; Peter
Schelkens, Vrije Univ. Brussel (Belgium); Paul Scheunders,
Univ. Antwerpen (Belgium); Ivan W. Selesnick, Polytechnic Univ.;
Kenneth W. Tobin, Jr., Oak Ridge National Lab.; Günther
K. G. Wernicke, Humboldt-Univ. zu Berlin (Germany); Gerald Zauner,
Fachhochschule Wels (Austria)

Post-Meeting Proceedings Due Dates:

Abstract (500 words) Due Date: 16 June 2008 Final Summary (200 words)
Due Date: 17 November 2008 Manuscript Due Date: 22 December 2008

The wavelet transform, multiresolution analysis, and other
space-frequency or space-scale approaches are now considered standard
tools by researchers in image and signal processing. Promising
practical results in machine vision and sensors for industrial
applications and non destructive testing have been obtained, and a lot
of ideas can be applied to industrial imaging projects.  This
conference is intended to bring together practitioners, researchers,
and technologists in machine vision, sensors, non destructive testing,
signal and image processing to share recent developments in wavelet
and multiresolution approaches. Papers emphasizing fundamental methods
that are widely applicable to industrial inspection and other
industrial applications are especially welcome.  Papers are solicited
but not limited to the following areas: New trends in wavelet and
multiresolution approach, frame and overcomplete representations,
Gabor transform, space-scale and space-frequency analysis,
multiwavelets, directional wavelets, lifting scheme for:

    •    sensors
    •    signal and image denoising, enhancement, segmentation, image deblurring
    •    texture analysis
    •    pattern recognition
    •    shape recognition
    •    3D surface analysis, characterization, compression
    •    acoustical signal processing
    •    stochastic signal analysis
    •    seismic data analysis
    •    real-time implementation
    •    image compression
    •    hardware, wavelet chips
Applications:
    •    machine vision
    •    aspect inspection
    •    character recognition
    •    speech enhancement
    •    robot vision
    •    image databases
    •    image indexing or retrieval
    •    data hiding
    •    image watermarking
    •    non destructive evaluation
    •    metrology
    •    real-time inspection.
Applications in microelectronics manufacturing, web and paper
products, glass, plastic, steel, inspection, power production,
chemical process, food and agriculture, pharmaceuticals, petroleum
industry.  Note: All submissions will be peer reviewed. Please note
that abstracts must be at least 500 words in length in order to
receive full consideration.