*********************** Title: 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, and Room Temperature Semiconductor Detectors Workshop Abbreviation: 2010 IEEE NSS/MIC/RTSD Venue: Knoxville Convention Center Location: Knoxville, Tennessee, USA Starting Date: 30-Oct-2010 Ending Date: 06-Nov-2010 Conference Chair: Ron Keyser, ORTEC URL: http://www.nss-mic.org/2010 Conference e-mail: firstname.lastname@example.org Abstract Submission Deadline: 10-May-2010 Short description: The Nuclear Science Symposium (NSS) offers an outstanding opportunity for scientists and engineers interested or actively working in the fields of nuclear science, radiation instrumentation, software and their applications, to meet and discuss with colleagues from around the world. The program emphasizes the latest developments in technology and instrumentation and their implementation in experiments for space sciences, accelerators, other radiation environments, and homeland security. The Medical Imaging Conference (MIC) is the foremost international scientific meeting on the physics, engineering and mathematical aspects of nuclear medicine based imaging. As the field develops, multi-modality approaches are becoming more and more important. The content of the MIC reflects this, with a growing emphasis on the methodologies of X-ray, optical and MR imaging as they relate to nuclear imaging techniques. In addition, specialized topics will be addressed in the Short Courses and Workshops programs. The Workshop on Room-Temperature Semiconductor Detectors (RTSD) represents the largest forum of scientists and engineers developing new semiconductor radiation detectors and imaging arrays. Room-temperature solid-state radiation detectors for X-ray, gamma-ray, and neutron radiation are finding increasing applications in such diverse fields as medicine, homeland security, astrophysics and environmental remediation. The objective of this workshop is to provide a forum for discussion of the state of the art of material development for semiconductor, scintillator, and organic materials for detection, materials characterization, device fabrication and technology, electronics and applications.